75 lines
2.7 KiB
C
75 lines
2.7 KiB
C
/***********************************************************************
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* *
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* This software is part of the ast package *
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* Copyright (c) 1982-2011 AT&T Intellectual Property *
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* Copyright (c) 2020-2021 Contributors to ksh 93u+m *
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* and is licensed under the *
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* Eclipse Public License, Version 1.0 *
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* by AT&T Intellectual Property *
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* *
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* A copy of the License is available at *
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* http://www.eclipse.org/org/documents/epl-v10.html *
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* (with md5 checksum b35adb5213ca9657e911e9befb180842) *
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* *
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* Information and Software Systems Research *
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* AT&T Research *
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* Florham Park NJ *
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* *
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* David Korn <dgk@research.att.com> *
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* *
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***********************************************************************/
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#pragma prototyped
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#ifndef TEST_ARITH
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/*
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* UNIX shell
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* David Korn
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* AT&T Labs
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*
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*/
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#include "FEATURE/options"
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#include "defs.h"
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#include "shtable.h"
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/*
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* These are the valid test operators
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*/
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#define TEST_ARITH 040 /* arithmetic operators */
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#define TEST_BINOP 0200 /* binary operator */
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#define TEST_PATTERN 0100 /* turn off bit for pattern compares */
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#define TEST_NE (TEST_ARITH|9)
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#define TEST_EQ (TEST_ARITH|4)
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#define TEST_GE (TEST_ARITH|5)
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#define TEST_GT (TEST_ARITH|6)
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#define TEST_LE (TEST_ARITH|7)
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#define TEST_LT (TEST_ARITH|8)
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#define TEST_OR (TEST_BINOP|1)
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#define TEST_AND (TEST_BINOP|2)
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#define TEST_SNE (TEST_PATTERN|1)
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#define TEST_SEQ (TEST_PATTERN|14)
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#define TEST_PNE 1
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#define TEST_PEQ 14
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#define TEST_EF 3
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#define TEST_NT 10
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#define TEST_OT 12
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#define TEST_SLT 16
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#define TEST_SGT 17
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#define TEST_END 8
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#define TEST_REP 20
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extern int test_unop(Shell_t*,int, const char*);
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extern int test_inode(const char*, const char*);
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extern int test_binop(Shell_t*,int, const char*, const char*);
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extern const char sh_opttest[];
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extern const char test_opchars[];
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extern const char e_argument[];
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extern const char e_missing[];
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extern const char e_badop[];
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extern const char e_unsupported_op[];
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extern const char e_tstbegin[];
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extern const char e_tstend[];
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#endif /* TEST_ARITH */
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